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Issue 9, 2009
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Critical revision of GD-MS, LA-ICP-MS and SIMS as inorganic mass spectrometric techniques for direct solid analysis

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Abstract

Inorganic mass spectrometric techniques and methods for direct solid analysis are widely required to obtain valuable information about the multi-elemental spatial distribution of the major and trace constituents and/or isotope ratio information of a sample in a wide variety of solid specimens, including environmental wastes, biological samples, geochemical materials, coatings and semiconductors. The increasing need to characterize complex materials in industry (e.g. production control and quality assurance processes), and in different fields of science is forcing the development of various inorganic mass spectrometric methods for direct solid chemical analysis. These methods allow the characterization of solid materials both in bulk and in spatially resolved analysis (with lateral and/or in-depth resolution). This review critically discusses the analytical performance, capabilities, pros and cons, and trends of laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS), secondary ion (neutral) mass spectrometry (SIMS/SNMS), and glow discharge mass spectrometry (GD-MS) because they represent the most widespread and powerful inorganic mass spectrometric methods currently further improved and applied for the direct characterization of solids.

Graphical abstract: Critical revision of GD-MS, LA-ICP-MS and SIMS as inorganic mass spectrometric techniques for direct solid analysis

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Publication details

The article was received on 06 Mar 2009, accepted on 19 May 2009 and first published on 08 Jun 2009


Article type: Critical Review
DOI: 10.1039/B904698D
Citation: J. Anal. At. Spectrom., 2009,24, 1145-1160
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    Critical revision of GD-MS, LA-ICP-MS and SIMS as inorganic mass spectrometric techniques for direct solid analysis

    J. Pisonero, B. Fernández and D. Günther, J. Anal. At. Spectrom., 2009, 24, 1145
    DOI: 10.1039/B904698D

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