Potential analytical applications of negative ions from a pulsed radiofrequency glow discharge in argon

Stela Canulescu; James Whitby; Katrin Fuhrer; Markus Hohl; Marc Gonin; Thomas Horvath; Johann Michler

doi:10.1039/B818954D

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Journal of Analytical Atomic Spectrometry

Issue 2, 2009

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Potential analytical applications of negative ions from a pulsed radiofrequency glow discharge in argon

Stela Canulescu , James Whitby , Katrin Fuhrer , Markus Hohl , Marc Gonin , Thomas Horvath and Johann Michler

J. Anal. At. Spectrom., 2009, 24, 178-180

DOI: 10.1039/B818954D
Received 27 Oct 2008, Accepted 16 Dec 2008
First published on the web 24 Dec 2008

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Abstract
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Detection of negative ions from a conventional analytical glow discharge source using argon as the working gas is reported. The negative ions are recorded using a pulsed discharge source coupled with a time-of-flight mass spectrometer. A considerable enhancement in the “afterglow” region of the negative ion signal for halogens and halogenated molecules and reduction in background is observed. This is the first time when negative ions have been reported for halogen containing materials and we illustrate our findings with results from the polytetrafluoroethene polymer (PTFE).

Abstract from Mass Spectrometry Bulletin 2009

Glow discharge, Negative ions, Time-of-flight spectrometer, Ar, Polytetrafluoroethene.

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Articles By

Stela Canulescu
James Whitby
Katrin Fuhrer
Markus Hohl
Marc Gonin
Thomas Horvath
Johann Michler

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Journal of Analytical Atomic Spectrometry

Potential analytical applications of negative ions from a pulsed radiofrequency glow discharge in argon

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