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Issue 2, 2009
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Potential analytical applications of negative ions from a pulsed radiofrequency glow discharge in argon

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Abstract

Detection of negative ions from a conventional analytical glow discharge source using argon as the working gas is reported. The negative ions are recorded using a pulsed discharge source coupled with a time-of-flight mass spectrometer. A considerable enhancement in the “afterglow” region of the negative ion signal for halogens and halogenated molecules and reduction in background is observed. This is the first time when negative ions have been reported for halogen containing materials and we illustrate our findings with results from the polytetrafluoroethene polymer (PTFE).

Graphical abstract: Potential analytical applications of negative ions from a pulsed radiofrequency glow discharge in argon

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Publication details

The article was received on 27 Oct 2008, accepted on 16 Dec 2008 and first published on 24 Dec 2008


Article type: Communication
DOI: 10.1039/B818954D
Citation: J. Anal. At. Spectrom., 2009,24, 178-180
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    Potential analytical applications of negative ions from a pulsed radiofrequency glow discharge in argon

    S. Canulescu, J. Whitby, K. Fuhrer, M. Hohl, M. Gonin, T. Horvath and J. Michler, J. Anal. At. Spectrom., 2009, 24, 178
    DOI: 10.1039/B818954D

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