SNIM: Scanning near-field infrared microscopy

Erik Bründermann; Martina Havenith

doi:10.1039/B703982B

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Annual Reports Section "C" (Physical Chemistry)

Issue 0, 2008

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SNIM: Scanning near-field infrared microscopy

Erik Bründermann and Martina Havenith

Annu. Rep. Prog. Chem., Sect. C: Phys. Chem., 2008, 104, 235-255

DOI: 10.1039/B703982B
First published on the web 01 Apr 2008

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Scanning near-field infrared microscopy is a powerful label-free technique for chemical imaging with nanometre resolution. It is on the verge of wide-spread applications due to the development of tuneable, easy access high power infrared light sources. Spatial resolution of 10–100 nm is nowadays routinely obtained. Current research activities are shifting from pure instrument development towards applications in the field of material science and biology. This includes detection of the Mott-transition in nano-domains, mapping of the doping concentration in semiconductors, surface characterization with a sensitivity of a single monolayer, and infrared spectroscopy of a single virus.

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Annual Reports Section "C" (Physical Chemistry)

SNIM: Scanning near-field infrared microscopy

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