Quantitative analysis of silicate certified reference materials by LA-ICPMS with and without an internal standard

Joel E. Gagnon Brian J. Fryer Iain M. Samson and Anthony E. Williams-Jones
J. Anal. At. Spectrom., 2008, 23, 1529-1537

DOI: 10.1039/B801807N
Received 31 Jan 2008, Accepted 10 Jul 2008
First published on the web 28 Aug 2008
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