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Volume 138, 2008
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Energy dispersive X-ray spectroscopy of bimetallic nanoparticles in an aberration corrected scanning transmission electron microscope

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Abstract

The technique of X-ray energy dispersive spectroscopy (XEDS) spectrum imaging in a dedicated scanning transmission electron microscope (STEM) is discussed in relation to its applicability to bimetallic nanoparticles. It is shown that the recent availability of aberration corrected microscopes and multivariate statistical analysis (MSA) techniques has allowed us to overcome many of the intrinsic limitations previously encountered when attempting STEM-XEDS spectrum imaging on nanoscopic volumes of material. We demonstrate through a variety of applications to Au–Ag and Au–Pd bimetallic nanoparticle systems, that STEM-XEDS can provide invaluable high spatial resolution compositional information on (i) alloy homogeneity and phase segregation effects within individual nanoparticles, (ii) particle size–alloy composition correlations, (iii) the detection of trace amounts of alloying element and (iv) metal component distribution in extremely highly dispersed catalyst systems.

  • This article is part of the themed collection: Nanoalloys
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Publication details

The article was received on 25 Apr 2007, accepted on 08 Jun 2007 and first published on 13 Sep 2007


Article type: Paper
DOI: 10.1039/B706293C
Citation: Faraday Discuss., 2008,138, 337-351
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    Energy dispersive X-ray spectroscopy of bimetallic nanoparticles in an aberration corrected scanning transmission electron microscope

    A. A. Herzing, M. Watanabe, J. K. Edwards, M. Conte, Z. Tang, G. J. Hutchings and C. J. Kiely, Faraday Discuss., 2008, 138, 337
    DOI: 10.1039/B706293C

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