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Issue 31, 2008
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Viscoelastic, mechanical, and dielectric measurements on complex samples with the quartz crystal microbalance

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Abstract

Piezoelectric resonators have been in use as mass-sensing devices for almost half a century. More recently it was recognized that shifts in frequency and bandwidth can come about by a diverse variety of interactions with the sample. The classical “load” consists of a thin film, which shifts the resonance frequency due to its inertia. Other types of loading include semi-infinite viscoelastic media, rough objects contacting the crystal via isolated asperities, mechanically nonlinear contacts, and dielectric films. All these interactions can be analyzed within the small-load approximation. The small-load approximation provides a unified frame for interpretation and thereby opens the way to new applications of the QCM.

Graphical abstract: Viscoelastic, mechanical, and dielectric measurements on complex samples with the quartz crystal microbalance

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Publication details

The article was received on 06 Mar 2008, accepted on 21 May 2008 and first published on 27 Jun 2008


Article type: Perspective
DOI: 10.1039/B803960G
Citation: Phys. Chem. Chem. Phys., 2008,10, 4516-4534
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    Viscoelastic, mechanical, and dielectric measurements on complex samples with the quartz crystal microbalance

    D. Johannsmann, Phys. Chem. Chem. Phys., 2008, 10, 4516
    DOI: 10.1039/B803960G

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