Thin chitosan films as a platform for SPR sensing of ferric ions
Abstract
Homogeneous chitosan films of various thicknesses (10–65 nm) were deposited on thin
- This article is part of the themed collection: Detection for Security
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* Corresponding authors
a
Department of Materials Science and Engineering; Drexel University, 3141 Chestnut St., Philadelphia, PA, USA
E-mail:
sabine.szunerits@lepmi.inpg.fr
Fax: +33 (0)4 76 82 66 30
Tel: +33 (0)4 76 82 65 52
b Institut de Recherche Interdisciplinaire (IRI), USR CNRS 3078, Institut d'Electronique, de Microélectronique et de Nanotechnologie (IEMN), UMR CNRS-8520, Cité Scientifique, Avenue Poincaré - BP. 60069, Villeneuve d'Ascq, France
c Laboratoire d'Electrochimie et de Physicochimie des Matériaux et des Interfaces (LEPMI), CNRS-INPG-UJF, 1130 rue de la piscine, St. Martin d'Hères Cedex, France
Homogeneous chitosan films of various thicknesses (10–65 nm) were deposited on thin
H. A. McIlwee, C. L. Schauer, V. G. Praig, R. Boukherroub and S. Szunerits, Analyst, 2008, 133, 673 DOI: 10.1039/B717736D
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