Observation of intermediate-range order in a nominally amorphous molecular semiconductor film

Daniel R. Blasini; Jonathan Rivnay; Detlef-M. Smilgies; Jason D. Slinker; Samuel Flores-Torres; Héctor D. Abruña; George G. Malliaras

doi:10.1039/B700505A

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Journal of Materials Chemistry

Issue 15, 2007

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Observation of intermediate-range order in a nominally amorphous molecular semiconductor film

Daniel R. Blasini , Jonathan Rivnay , Detlef-M. Smilgies , Jason D. Slinker , Samuel Flores-Torres , Héctor D. Abruña and George G. Malliaras

J. Mater. Chem., 2007, 17, 1458-1461

DOI: 10.1039/B700505A
Received 12 Jan 2007, Accepted 13 Feb 2007
First published on the web 20 Feb 2007

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Abstract
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Synchrotron X-ray diffraction from a nominally amorphous molecular semiconductor film reveals both the presence of intermediate-range order (IRO) corresponding to crystalline domains with an average size of a few nanometres, and the growth of these domains upon exposure of the film to moisture.

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Daniel R. Blasini
Jonathan Rivnay
Detlef-M. Smilgies
Jason D. Slinker
Samuel Flores-Torres
Héctor D. Abruña
George G. Malliaras

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Journal of Materials Chemistry

Observation of intermediate-range order in a nominally amorphous molecular semiconductor film

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