Exploring nanoscale electrical and electronic properties of organic and polymeric functional materials by atomic force microscopy based approaches

Vincenzo Palermo; Andrea Liscio; Matteo Palma; Mathieu Surin; Roberto Lazzaroni; Paolo Samorì

doi:10.1039/B701015J

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Chemical Communications

Issue 32, 2007

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Exploring nanoscale electrical and electronic properties of organic and polymeric functional materials by atomic force microscopy based approaches

Vincenzo Palermo , Andrea Liscio , Matteo Palma , Mathieu Surin , Roberto Lazzaroni and Paolo Samorì

Chem. Commun., 2007, 3326-3337

DOI: 10.1039/B701015J
Received 23 Jan 2007, Accepted 09 Mar 2007
First published on the web 30 Mar 2007

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Beyond imaging, atomic force microscopy (AFM) based methodologies enable the quantitative investigation of a variety of physico-chemical properties of (multicomponent) materials with a spatial resolution of a few nanometers. This Feature Article is focused on two AFM modes, i.e. conducting and Kelvin probe force microscopies, which allow the study of electrical and electronic properties of organic thin films, respectively. These nanotools provide a wealth of information on (dynamic) characteristics of tailor-made functional architectures, opening pathways towards their technological application in electronics, catalysis and medicine.

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Vincenzo Palermo
Andrea Liscio
Matteo Palma
Mathieu Surin
Roberto Lazzaroni
Paolo Samorì

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Chemical Communications

Exploring nanoscale electrical and electronic properties of organic and polymeric functional materials by atomic force microscopy based approaches

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