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Volume 132, 2006
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Nanoscale imaging of carbon nanotubes using tip enhanced Raman spectroscopy in reflection mode

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Abstract

An apertureless tip enhanced Raman spectrometer in reflection mode geometry is demonstrated. A spatial resolution as small as 30 nm was achieved. This was implemented by placing a sharp gold tip near the single wall carbon nanotubes using an atomic force microscope (AFM). The tip was illuminated from the same side of the sample which eliminated the need for a transparent substrate. The tip was maintained at a distance of a few nanometers using a quartz tuning fork. The Raman signal was collected from the G peak of the single wall carbon nanotubes using a single photon detecting module and topography image was acquired by the AFM.

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Publication details

The article was received on 06 May 2005, accepted on 31 May 2005 and first published on 03 Nov 2005


Article type: Paper
DOI: 10.1039/B506365E
Citation: Faraday Discuss., 2006,132, 215-225
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    Nanoscale imaging of carbon nanotubes using tip enhanced Raman spectroscopy in reflection mode

    D. Roy, J. Wang and M. E. Welland, Faraday Discuss., 2006, 132, 215
    DOI: 10.1039/B506365E

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