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Issue 4, 2005
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Toward on-chip X-ray analysis

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The possibility of performing chemical analysis and structure determinations with the use of X-rays in a microfluidic chip environment is explored. Externally generated radiation, radioisotope irradiation and on-chip generated X-rays were considered as excitation means for the performance of sample analysis with the techniques of X-ray fluorescence and diffraction. The absorption properties of chip-building materials by different radiation sources are reviewed and data on absorption coefficients calculated, upon which recommendations for optimisations with the use of various X-ray sources may be made. The capabilities and limitations of on-chip X-ray analysis are placed in perspective by preliminary experimental results of diffraction, fluorescence and on-chip X-ray generation experiments.

Graphical abstract: Toward on-chip X-ray analysis

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The article was received on 14 Oct 2004, accepted on 07 Feb 2005 and first published on 18 Feb 2005

Article type: Paper
DOI: 10.1039/B415836A
Citation: Lab Chip, 2005,5, 382-391
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    Toward on-chip X-ray analysis

    E. D. Greaves and A. Manz, Lab Chip, 2005, 5, 382
    DOI: 10.1039/B415836A

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