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Relative calibration mode for compositional depth profiling in GD-OES

Corresponding authors
Swiss Federal Laboratories for Materials Testing and Research (EMPA), Feuerwerkerstrasse 39, CH-3602 Thun, Switzerland
Atout & Progrès, 10 rue de la paix, F-75002 Paris, France
Department of Physics, University of Newcastle, NSW 2308, Australia
Jobin-Yvon Emission, 16-18 rue du Canal, F-91165 Longjumeau, France
J. Anal. At. Spectrom., 2004,19, 1354-1360

DOI: 10.1039/B406187J
Received 26 Apr 2004, Accepted 16 Jun 2004
First published online 03 Sep 2004
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Journal of Analytical Atomic Spectrometry - Information Point