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Innovative research on the fundamental theory and application of spectrometric techniques.
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Paper

Determination of Si in Standard Reference Material SRM 295x Silica-on-Filter

*
Corresponding authors
a
Analytical Chemistry Division, National Institute of Standards and Technology, Gaithersburg, USA
b
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, USA
J. Anal. At. Spectrom., 2003,18, 738-741

DOI: 10.1039/B212069K
Received 09 Dec 2002, Accepted 18 Mar 2003
First published online 30 Apr 2003
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Journal of Analytical Atomic Spectrometry - Information Point