Volume 121, 2002

An FTIR study of the surface chemistry of the dynamic Si(100) surface during etching in alkaline solution

Abstract

In situ FTIR spectroscopy has been used in the attenuated total reflectance (ATR) mode to investigate the surface chemistry of etching Si(100) surfaces in aqueous KOH. The effect of solution concentration and electrode potential on the Si–H vibrations has been explored and the experimental results compared with density functional theory calculations. In addition, the kinetics of surface passivation of n-Si(100) has been investigated using FTIR spectroscopy.

Article information

Article type
Paper
Submitted
10 Jan 2002
Accepted
24 Jan 2002
First published
06 Jun 2002

Faraday Discuss., 2002,121, 167-180

An FTIR study of the surface chemistry of the dynamic Si(100) surface during etching in alkaline solution

W. Haiss, P. Raisch, D. J. Schiffrin, L. Bitsch and R. J. Nichols, Faraday Discuss., 2002, 121, 167 DOI: 10.1039/B200408A

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