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Issue 18, 2000
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Charge transfer and fragmentation of liquid helium droplets doped with xenon

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The ionization and fragmentation of clusters containing 1100, 2200, 2800 or 3300 helium atoms, on average, and between one and four Xe atoms are studied by electron impact mass spectrometry. The results are quite different from those of earlier studies of helium clusters containing Ne and Ar atoms. The observation of the Xe+ fragment is much more probable for ionization of clusters containing a single Xe atom than is the observation of Ne+ or Ar+ for clusters that contain a single Ne or Ar atom. Also, clusters that contain two Xe atoms are much less likely to yield Xe2+ compared to the analogous process for clusters containing two Ne or Ar atoms. These differences are attributed to the fact that the charge transfer from He+ to Xe can lead to electronically excited Xe+ ions. Charge transfer from He+ to Xe is not substantially more probable than from He+ to Ne or Ar. The changes of the charge transfer probability and the fragmentation patterns with cluster size are discussed.

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Publication details

The article was received on 14 Mar 2000, accepted on 19 May 2000 and first published on 12 Jul 2000

Article type: Paper
DOI: 10.1039/B002051F
Citation: Phys. Chem. Chem. Phys., 2000,2, 4075-4080
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    Charge transfer and fragmentation of liquid helium droplets doped with xenon

    T. Ruchti, B. E. Callicoatt and K. C. Janda, Phys. Chem. Chem. Phys., 2000, 2, 4075
    DOI: 10.1039/B002051F

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