Growth of a mesostructured silica thin film at the air/water interface was observed in situ using Brewster angle microscopy and surface pressure measurements allowing real time observation of nucleation of the film and its rapid growth to full surface coverage at the end of the induction period.
In situ Brewster angle microscopy and surface pressure studies on the interfacial growth of mesostructured silica thin films
K. J. Edler, S. J. Roser and S. Mann, Chem. Commun., 2000, 773 DOI: 10.1039/B000375L
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