Application of total-reflection X-ray fluorescence spectrometry to elemental determinations in water, soil and sewage sludge samples

Abstract

Total-reflection X-ray fluorescence (TXRF) spectrometry represents a relatively new instrumental analytical technique for the determination of trace elements in liquid samples. In this study, a range of sample types common to the water industry have been analysed for their elemental composition by TXRF and inductively coupled plasma (ICP) spectrometry. The TXRF method was found to offer, in general, lower limits of detection than are possible with ICP spectrometry, 4–5 orders of magnitude range in calibration, a sample preparation precision of <3% and an instrumental precision of <1%. Results obtained by TXRF compared favourably with those acquired by ICP and with the reference values that were available. Preparation of the digested and aqueous-based samples for TXRF analysis offered a very simple internal standard method for calibration and required only very small volumes (≈ 10 µl).