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Issue 2, 1987
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Radiation damage in a phosphated sugar. An electron spin resonance study of phosphorus-centred radicals trapped in an X-irradiated single crystal of a phenoxyphosphoryl xylofuranose derivative

Abstract

Single crystals of 1,2-o-isopropylidene-3,5-o-phenoxyphosphoryl-α-D-xylofuranose have been X-irradiated at low temperature (ca. 77 K) and studied by e.s.r. spectroscopy. The angular dependence of the signals has led to the identification of four radicals: a phosphoranyl-type radical, two phosphonyl species and a radical pair, one of whose components is a phosphonyl-type radical. The 31P-hyperfine tensor has been obtained for each species and the pair has been characterized by its electron–electron dipolar interaction. It is shown that electron capture by a P[double bond, length as m-dash]O bond and homolytic scission of the various P—O bonds are involved in the radiation damage process.

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Article type: Paper
DOI: 10.1039/F19878300401
Citation: J. Chem. Soc., Faraday Trans. 1, 1987,83, 401-409
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    Radiation damage in a phosphated sugar. An electron spin resonance study of phosphorus-centred radicals trapped in an X-irradiated single crystal of a phenoxyphosphoryl xylofuranose derivative

    A. Celalyan-Berthier, T. Berclaz and M. Geoffroy, J. Chem. Soc., Faraday Trans. 1, 1987, 83, 401
    DOI: 10.1039/F19878300401

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