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Issue 6, 1981
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Critical reflection of neutrons. A new technique for investigating interfacial phenomena

Abstract

The possibility of using neutron critical reflection for investigating interfacial phenomena is assessed. Calculations of the reflectivity of neutrons as a function of angle of incidence have been made for a variety of interfaces, using both an optical model and the Schrödinger equation. The information on the structure of the interfacial region that could be derived from reflectivity profiles is described for the following systems: fatty acid multilayers, black films, the liquid–vapour interface for a one-component system, the solution–vapour interface and the electrode–solution interface.

Preliminary experiments have also been done to test the technique using thin films of deuterated stearic acid and copper on glass.

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Article type: Paper
DOI: 10.1039/F19817701437
Citation: J. Chem. Soc., Faraday Trans. 1, 1981,77, 1437-1448
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    Critical reflection of neutrons. A new technique for investigating interfacial phenomena

    J. B. Hayter, R. R. Highfield, B. J. Pullman, R. K. Thomas, A. I. McMullen and J. Penfold, J. Chem. Soc., Faraday Trans. 1, 1981, 77, 1437
    DOI: 10.1039/F19817701437

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